|JAI AD-080 CL||Data sheets||217.6 KB|
|JAI AD-081 CL||Data sheets||1.1 MB|
|JAI CM-030 GE / CB-030 GE||Data sheets||654.1 KB|
|JAI CM-040 GE / CB-040 GE||Data sheets||661.2 KB|
|JAI CM-080 GE / CB-080 GE||Data sheets||661.9 KB|
|JAI CM-140 GE / CB-140 GE||Data sheets||658.9 KB|
|JAI CM-140 MCL / CB-140 MCL||Data sheets||652.7 KB|
|JAI CM-200 GE / CB-200 GE||Data sheets||662.6 KB|
Optics and illumination play a critical role in optimising the imaging conditions for machine vision measurement. Even the seemingly simple act of adjusting the iris (aperture) of a lens affects several parameters in the imaging system. There are a number of ways of adjusting the iris, but the Precise-iris (or P-iris) method offers significant benefits.
The popular JAI GO-5100 compact, lightweight industrial cameras are now available with the high speed USB3 Vision interface as well as GigE Vision. The new JAI GO-5100-USB monochrome and colour cameras provide 5.1 MP resolution at a high frame rate of 74 fps. This means that users can benefit from the same outstanding image quality offered by the Sony Pregius IMX250 CMOS sensor whichever interface they prefer to use.
The new Wave series of dual-band line scan cameras from JAI operate in the Short Wave InfraRed (SWIR) region of the spectrum. The WA-1000D-CL simultaneously acquires and precisely aligns images from SWIR light between 900 and 1400 nm on one sensor and from 1400 nm to 1700 nm on the second sensor, even when objects are moving at high speeds. This has the potential to enhance current machine vision systems by revealing information that can’t be seen when using just the visible and/or the near infrared light spectrum.